| Product image |
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| Manufacturer |
Sonel |
Metrel |
Benning |
HT Instruments |
| Purchase |
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Classification
Device / set / accessories / field-ready configuration
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High
Moderately high costs
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High
High costs
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Low
low costs (separate accessories considered)
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Medium
medium costs (separate accessories considered)
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| Operating costs |
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Measurement / string
Assessment of measurement time and effort for UOC, ISC, RISO
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Medium
Fast measurement possible; prepared project structure reduces time between measurements
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Low
Very fast measurement possible; setup and operating logic are somewhat more complex
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Low
Very fast measurement possible; but no validation on the device
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High
Time-consuming measurement; setup and operating logic are complex
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Preparation / string
Effort for setup, assignment, structure and post-processing for UOC, ISC, RISO
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Low
One-time effort for project structure and procedures; afterwards very fast workflow for measurement and documentation
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Medium
One-time effort for project structure and procedures; more effort for transfer, documentation and data management
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High
Time-intensive preparation and post-processing in BTEC
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High
Time-intensive preparation and post-processing on device and software
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| Core functions |
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On-site measurement validation
Option for direct validation on the measuring device
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✓
Direct validation in the measurement result
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✓
Direct validation in the measurement result
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X
Manual validation in BTEC
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✓
Direct validation in the measurement result
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Auto procedures
Fixed / flexible measurement procedures and automated workflows
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✓
Flexible measurement procedures + automation
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✓
Flexible measurement procedures + automation
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✓
Fixed measurement procedures
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✓
Fixed measurement procedures
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Performance diagnostics
Environmental-data-supported curve measurement
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✓
Extended performance parameters: inclusion of module degradation and installation age
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✓
Only fill factor (FF) as performance parameter
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X
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X
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Fault diagnostics
Measurement functions that enable fault analysis
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✓
RISO (DC up to 1500 V with GFL, AC up to 1000 V), RLow (200 mA), bypass/blocking diode test
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✓
RISO (DC up to 1500 V), RLow (200 mA)
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✓
RISO (DC up to 1500 V), RLow (200 mA)
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✓
RISO (DC up to 1500 V), GFL, RLow (200 mA)
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PV module data
Internal device database/storage
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✓
PV module database from the cloud or locally editable
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✓
PV module database from MESM or locally editable
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X
No database/storage
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✓
Storage for 64 PV modules
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Visual inspection
Integrated in the measuring device
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✓
Flexibly configurable visual inspection (cloud-side and device-side)
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✓
User-defined visual inspection
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X
No visual inspection
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X
No visual inspection
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| Software |
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Name
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MeasureEffect
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MESM
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BTEC
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TOPVIEW
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Data transfer
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Wi-Fi / USB
Wi-Fi sync from measuring device to cloud; USB for local data
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USB / RS232
Local via USB / RS232 or data via mobile cloud app and cloud storage to MESM
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Bluetooth
Via Bluetooth to BTEC
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USB / Wi-Fi
Via USB / Wi-Fi to TOPVIEW
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Cloud
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✓
Full cloud with projects, procedures, data management and documentation
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✓
Cloud app and cloud storage as data transfer to MESM
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✓
Extensive cloud with projects, documentation and data management
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X
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Documentation creation
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✓
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✓
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✓
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✓
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| Measurement functions |
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Open-circuit voltage DC
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1500 V
max. 1650 V
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1500 V
max. 1700 V
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1500 V
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1500 V
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Max. short-circuit current DC
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40 A
Power-dependent: ISC(1000 V) = 40 A, ISC(1500 V) = 30 A
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40 A
Power-dependent: 48 kW
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25 A
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40 A
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Insulation measurement (DC side)
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up to 1500 V
250, 500, 1000, 1500 V; GFL function
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up to 1500 V
250, 500, 1000, 1500 V
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up to 1500 V
250, 500, 1000, 1500 V
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up to 1500 V
250, 500, 1000, 1500 V; GFL function
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Insulation measurement (AC side)
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up to 1000 V
250, 500, 1000 V
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X
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X
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X
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Protective conductor and equipotential bonding
with 200 mA
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✓
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✓
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✓
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✓
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Irradiance and temperature
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✓
with IRM-1 (all-in-one)
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✓
with A 1785 PV + A 1833 PV + A 1846 PV
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✓
with SUN 3 + temp. sensor (050424)
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✓
with SOLAR03 + HT305 + PT305
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Diode tests
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✓
Measurement of bypass and blocking diodes
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X
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X
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X
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Operating currents
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✓
with CMP-1015 PV
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X
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✓
with CM 3-PV
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X
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